The MEM/Rietveld method with nano-applications – accurate charge-density studies of nano-structured materials by synchrotron-radiation powder diffraction

Acta Crystallographica Section A
Acta Crystallographica
Section A FOUNDATIONS AND ADVANCES

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Figure 5
Flow chart of the MEM/Rietveld method with structure modeling and imaging of charge density.

FOUNDATIONS
ADVANCES

ISSN: 2053-2733

Volume 64| Part 1| January 2008| Pages 232-245

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