High-quality quartz single crystals for high-energy-resolution inelastic X-ray scattering analyzers

Hönnicke, M.G.; Huang, X.; Cusatis, C.; Koditwuakku, C.N.; Cai, Y.Q.

doi:10.1107/S0021889813004731

Journal of Applied Crystallography Journal of Applied

Crystallography

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Figure 5

Variations in the lattice parameter map (Δd/d map) of the α-SiO₂ $[\overline 4220]$ (X-cut) crystal. The map was taken on the dashed area a1 shown in Fig. 4

(b). Dashed triangles in (a) are the areas where there is a surface flatness: (i) wedge area (due to the orientation flats provided by the manufacturer) and (ii) thickness variation area mostly due to the non-homogeneous etching procedure

JOURNAL OF

APPLIED

CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 46| Part 4| June 2013| Pages 939-944

doi:10.1107/S0021889813004731

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