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ChemInform Abstract: Defect Spectroscopy in Semiconductors
First published: April 6, 1993
Abstract
ChemInform is a weekly Abstracting Service, delivering concise information at a glance that was extracted from about 100 leading journals. To access a ChemInform Abstract of an article which was published elsewhere, please select a “Full Text” option. The original article is trackable via the “References” option.
ChemInform Abstract
(presentation of some recent developments in defect characterization including highlights from work on II-VI, III-V, and IV-IV semiconductors obtained by combination of several measurement techniques such as ISCT (junction space charge techniques) and bulk methods such as PTIS (high-resolution photothermal ionization spectroscopy); 33 refs.).
