Langevin Forces and Generalized Transfer Fields for Noise Modelling in Deep Submicron Devices
First published: 01 January 2001
Abstract
We present a generalized transfer field method with the microscopic noise sources directly connected with the velocity and energy change during single scattering events. The advantages of this method are illustrated by hydrodynamic calculations of current and voltage noise spectra in several two-terminal submicron structures.
