X-ray diffraction method for determination of interplanar spacing and temperature distribution in crystals under an external temperature gradient

An X-ray diffraction method is developed for the determination of the distribution of temperature and interplanar spacing in a single-crystal plate. In particular, the temperature and the interplanar spacing differences in two different parts of a quartz single crystal of X-cut are experimentally determined depending on the value of the temperature gradient applied perpendicularly to the reflecting atomic planes (). The temperature distribution along the direction perpendicular to the reflecting atomic planes () and the interplanar spacing distribution of atomic planes () are determined as well.