Volume 45, Issue 3 pp. 594-597

XBroad: program for extracting basic microstructure information from X-ray diffraction patterns in few clicks

First published: 25 May 2012
Jasminka Popovic, e-mail: [email protected]

Abstract

XBroad is a public domain program designed for easy determination of basic microstructural information from powder X-ray diffraction data. Nowadays, preparation of nanomaterials with controlled particle size and shape has been found to be essential for tailoring the desired material properties, so a quick and effective line broadening analysis is an imperative. Although the methods implemented in the program are considered to be `traditional' ones, the authors believe that the program will provide a very fast platform for non-crystallographers working in the field of materials science, as well as for students learning the basics of size–strain analysis.

The full text of this article hosted at iucr.org is unavailable due to technical difficulties.