Volume 34, Issue 2 pp. 129-134
Original Article
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The Prospects of a Subnanometer Focused Neon Ion Beam

F. H. M. Rahman

F. H. M. Rahman

Carl Zeiss NTS, Peabody, Massachusetts

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Shawn McVey

Shawn McVey

Carl Zeiss NTS, Peabody, Massachusetts

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Louis Farkas

Louis Farkas

Carl Zeiss NTS, Peabody, Massachusetts

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John A. Notte

Corresponding Author

John A. Notte

Carl Zeiss NTS, Peabody, Massachusetts

Carl Zeiss NTS, 1 Corporation Way, Peabody, MA 01960Search for more papers by this author
Shida Tan

Shida Tan

Intel Corporation, Santa Clara, California

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Richard H. Livengood

Richard H. Livengood

Intel Corporation, Santa Clara, California

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First published: 27 July 2011
Citations: 64

Summary

The success of the helium ion microscope has encouraged extensions of this technology to produce beams of other ion species. A review of the various candidate ion beams and their technical prospects suggest that a neon beam might be the most readily achieved. Such a neon beam would provide a sputtering yield that exceeds helium by an order of magnitude while still offering a theoretical probe size less than 1-nm. This article outlines the motivation for a neon gas field ion source, the expected performance through simulations, and provides an update of our experimental progress. SCANNING 33: 129–134, 2012. © 2011 Wiley Periodicals, Inc.

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