Volume 33, Issue 3 pp. 135-146
Research Article
Free to Read

Three-dimensional electron microscopy simulation with the CASINO Monte Carlo software

Hendrix Demers

Hendrix Demers

Electrical and Computer Engineering Department, Universite de Sherbrooke, Sherbrooke, Quebec, Canada

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Nicolas Poirier-Demers

Nicolas Poirier-Demers

Electrical and Computer Engineering Department, Universite de Sherbrooke, Sherbrooke, Quebec, Canada

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Alexandre Réal Couture

Alexandre Réal Couture

Electrical and Computer Engineering Department, Universite de Sherbrooke, Sherbrooke, Quebec, Canada

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Dany Joly

Dany Joly

Electrical and Computer Engineering Department, Universite de Sherbrooke, Sherbrooke, Quebec, Canada

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Marc Guilmain

Marc Guilmain

Electrical and Computer Engineering Department, Universite de Sherbrooke, Sherbrooke, Quebec, Canada

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Niels de Jonge

Niels de Jonge

Department of Molecular Physiology and Biophysics, Vanderbilt University School of Medicine, Nashville, Tennessee

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Dominique Drouin

Corresponding Author

Dominique Drouin

Electrical and Computer Engineering Department, Universite de Sherbrooke, Sherbrooke, Quebec, Canada

Electrical and Computer Engineering Department, Universite de Sherbrooke, Sherbrooke, Quebec, Canada J1K 2R1Search for more papers by this author
First published: 18 July 2011
Citations: 281

Abstract

Monte Carlo softwares are widely used to understand the capabilities of electron microscopes. To study more realistic applications with complex samples, 3D Monte Carlo softwares are needed. In this article, the development of the 3D version of CASINO is presented. The software feature a graphical user interface, an efficient (in relation to simulation time and memory use) 3D simulation model, accurate physic models for electron microscopy applications, and it is available freely to the scientific community at this website: www.gel.usherbrooke.ca/casino/index.html. It can be used to model backscattered, secondary, and transmitted electron signals as well as absorbed energy. The software features like scan points and shot noise allow the simulation and study of realistic experimental conditions. This software has an improved energy range for scanning electron microscopy and scanning transmission electron microscopy applications. SCANNING 33:135–146, 2011. © 2011 Wiley Periodicals, Inc.

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