Volume 31, Issue 3 pp. 122-126
Research Article
Free to Read

Site-specific dual ink dip pen nanolithography™

Omkar A. Nafday

Corresponding Author

Omkar A. Nafday

NanoInk Inc., Skokie, Illinois

NanoInk Inc., 8025 Lamon Ave., Skokie, IL 60077Search for more papers by this author
Jason R. Haaheim

Jason R. Haaheim

NanoInk Inc., Skokie, Illinois

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Fredy Villagran

Fredy Villagran

NanoInk Inc., Skokie, Illinois

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First published: 02 June 2009
Citations: 9

Abstract

The ability to deposit different materials with nanoscale precision at user-specified locations is a very important attribute of dip pen nanolithography (DPN®). However, the potential of DPN goes beyond simple deposition since DPN used in conjunction with lateral force microscopy (LFM) allows site-specific investigations of nanoscale properties. In this work, we use two different inks, 16-mercaptohexadecanoic acid (MHA) and 1-octadecanethiol (ODT) to show site-specific dual ink DPN enabled exclusively by our proprietary software. A diamond-dot pattern was created by using a layer-to-layer alignment (LLA) algorithm, which enables a MHA pattern (diamond) to be written concentric with another ODT (central dot) pattern. This simple demonstration of multi-ink DPN is not specific to alkanethiol ink systems, but is also applicable to other multi-material patterning, interaction, and exchange studies. SCANNING 31: 122–126, 2009. © 2009 Wiley Periodicals, Inc.

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