High-precision determination of the absolute value of lattice parameter for cubic single crystals is demonstrated by the example of silicon using coincidental multi-beam X-ray diffraction realized by superposition of two three-beam reflections at fixed sample temperature. Based on a semi-kinematical approximation of X-ray scattering theory, the algorithm for calculation of multi-beam diffractograms is developed enabling a more thorough quantitative analysis of experimental results.

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Volume206, Issue8

Special Issue:High Resolution X‐Ray Diffraction and Imaging (XTOP)

August 2009

Pages 1699-1703

Lattice parameter determination by coincidental multi-beam X-ray diffraction

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Lattice parameter determination by coincidental multi-beam X-ray diffraction

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