Volume 89, Issue 1 pp. 411-422
RESEARCH ARTICLE

IMPULSED model based cytological feature estimation with U-Net: Application to human brain tumor at 3T

Jian Wu

Jian Wu

Department of Electronic Science, Fujian Provincial Key Laboratory of Plasma and Magnetic Resonance, Xiamen University, Xiamen, China

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Taishan Kang

Taishan Kang

Department of Radiology, Zhongshan Hospital of Xiamen University, School of Medicine, Xiamen University, Xiamen, China

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Xinli Lan

Xinli Lan

Department of Electronic Science, Fujian Provincial Key Laboratory of Plasma and Magnetic Resonance, Xiamen University, Xiamen, China

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Xinran Chen

Xinran Chen

Department of Electronic Science, Fujian Provincial Key Laboratory of Plasma and Magnetic Resonance, Xiamen University, Xiamen, China

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Zhigang Wu

Zhigang Wu

MSC Clinical & Technical Solutions, Philips Healthcare, Beijing, China

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Jiazheng Wang

Jiazheng Wang

MSC Clinical & Technical Solutions, Philips Healthcare, Beijing, China

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Liangjie Lin

Liangjie Lin

MSC Clinical & Technical Solutions, Philips Healthcare, Beijing, China

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Congbo Cai

Congbo Cai

Department of Electronic Science, Fujian Provincial Key Laboratory of Plasma and Magnetic Resonance, Xiamen University, Xiamen, China

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Jianzhong Lin

Jianzhong Lin

Department of Radiology, Zhongshan Hospital of Xiamen University, School of Medicine, Xiamen University, Xiamen, China

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Xin Ding

Xin Ding

Department of Pathology, Zhongshan Hospital of Xiamen University, School of Medicine, Xiamen University, Xiamen, China

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Shuhui Cai

Corresponding Author

Shuhui Cai

Department of Electronic Science, Fujian Provincial Key Laboratory of Plasma and Magnetic Resonance, Xiamen University, Xiamen, China

Correspondence

Shuhui Cai, Department of Electronic Science, Xiamen University, Xiamen 361005, China.

Email: [email protected]

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First published: 05 September 2022
Citations: 5

Jian Wu and Taishan Kang contributed equally to this work.

Funding information: National Natural Science Foundation of China, Grant/Award Numbers: 11775184; 82071913; 82102021; U1805261; Science and Technology Project of Fujian Province of China, Grant/Award Number: 2019Y0001

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Abstract

Purpose

This work introduces and validates a deep-learning-based fitting method, which can rapidly provide accurate and robust estimation of cytological features of brain tumor based on the IMPULSED (imaging microstructural parameters using limited spectrally edited diffusion) model fitting with diffusion-weighted MRI data.

Methods

The U-Net was applied to rapidly quantify extracellular diffusion coefficient (Dex), cell size (d), and intracellular volume fraction (vin) of brain tumor. At the training stage, the image-based training data, synthesized by randomizing quantifiable microstructural parameters within specific ranges, was used to train U-Net. At the test stage, the pre-trained U-Net was applied to estimate the microstructural parameters from simulated data and the in vivo data acquired on patients at 3T. The U-Net was compared with conventional non-linear least-squares (NLLS) fitting in simulations in terms of estimation accuracy and precision.

Results

Our results confirm that the proposed method yields better fidelity in simulations and is more robust to noise than the NLLS fitting. For in vivo data, the U-Net yields obvious quality improvement in parameter maps, and the estimations of all parameters are in good agreement with the NLLS fitting. Moreover, our method is several orders of magnitude faster than the NLLS fitting (from about 5 min to <1 s).

Conclusion

The image-based training scheme proposed herein helps to improve the quality of the estimated parameters. Our deep-learning-based fitting method can estimate the cell microstructural parameters fast and accurately.

CONFLICT OF INTEREST

Zhigang Wu, Jiazheng Wang, and Liangjie Lin are employed by Philips Healthcare China. All other authors declare no competing financial interests.

DATA AVAILABILITY STATEMENT

The code used in this study is available at https://github.com/wjgxw/ogse. All data necessary for this study are available from the corresponding author upon reasonable request.

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