Volume 3, Issue 7 pp. 229-233
Article
Full Access

Measurements of signal transmission to 20 GHz and crosstalk to 10 GHz on small copper microstrips embedded in polyimide dielectric

J. S. Loos

J. S. Loos

AT & T Bell Laboratories Murray Hill, New Jersey 07974

Search for more papers by this author
A. H. Engvik

A. H. Engvik

AT & T Bell Laboratories Murray Hill, New Jersey 07974

Search for more papers by this author
M. S. Lin

M. S. Lin

AT & T Bell Laboratories Murray Hill, New Jersey 07974

Search for more papers by this author
C. G. Lin-Hendel

C. G. Lin-Hendel

AT & T Bell Laboratories Murray Hill, New Jersey 07974

Search for more papers by this author
First published: July 1990
Citations: 6

Abstract

Multi-GHz measurements of signal propagation and crosstalk are reported for small, somewhat resistive, copper microstrips (20-30 μm width and 2-3 μm thickness) that are embedded in polyimide dielectric and fabricated on a silicon substrate. The transmission, reflection, signal velocity, and crosstalk on 50-Ω terminated microstrips are well behaved and, moreover, are well described by standard transmission line theory when resistive losses (corrected for the skin effect) are included.

The full text of this article hosted at iucr.org is unavailable due to technical difficulties.