ChemInform Abstract: X-Ray Diffraction Study of Ge—Bi—Te Mixed-Layer Ternary Compounds.
Abstract
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ChemInform Abstract
Atom coordinates, interatomic distances, and lattice parameters of the three ternary compounds Ge3Bi2Te6, GeBi6Te10 and Ge2Bi10Te17 belonging to the homologous series nGeTe×mBi2Te3 are determined. The unit cell of these ternary compounds contains 11-layered stacks, which are connected one to another via bonds with partial covalent as well as van der Waals character.