Volume 32, Issue 18
Physical Inorganic Chemistry
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ChemInform Abstract: X-Ray Diffraction Study of Ge—Bi—Te Mixed-Layer Ternary Compounds.

O. G. Karpinskii

O. G. Karpinskii

Inst. metall. im. Baikova Ross. Akad. nauk, Moskva 117334, Russia

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L. E. Shelimova

L. E. Shelimova

Inst. metall. im. Baikova Ross. Akad. nauk, Moskva 117334, Russia

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M. A. Kretova

M. A. Kretova

Inst. metall. im. Baikova Ross. Akad. nauk, Moskva 117334, Russia

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V. S. Zemskov

V. S. Zemskov

Inst. metall. im. Baikova Ross. Akad. nauk, Moskva 117334, Russia

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First published: 27 May 2010

Abstract

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ChemInform Abstract

Atom coordinates, interatomic distances, and lattice parameters of the three ternary compounds Ge3Bi2Te6, GeBi6Te10 and Ge2Bi10Te17 belonging to the homologous series nGeTe×mBi2Te3 are determined. The unit cell of these ternary compounds contains 11-layered stacks, which are connected one to another via bonds with partial covalent as well as van der Waals character.

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