Annalen der Physik
Volume 516, Issue 1-2 pp. 95-96
Original Paper

Domain wall creep in mixed c-a axis Pb(Zr0.2Ti0.8)O3 thin films

P. Paruch, 

Corresponding Author

P. Paruch

DPMC, University of Geneva, 24 Quai Ernest-Ansermet, 1211 Geneva 4, Switzerland

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T. Giamarchi, 

T. Giamarchi

DPMC, University of Geneva, 24 Quai Ernest-Ansermet, 1211 Geneva 4, Switzerland

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J.-M. Triscone, 

J.-M. Triscone

DPMC, University of Geneva, 24 Quai Ernest-Ansermet, 1211 Geneva 4, Switzerland

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First published: 10 February 2004
https://doi.org/10.1002/andp.200451601-230
Citations: 2

Abstract

Creep motion of ferroelectric domain walls in epitaxial Pb(Zr0.2Ti0.8)O3 thin films was studied by atomic force microscopy. The dynamical exponent μ was found to be smaller than in previous reports, with values significantly lower than 1 observed in samples with a-axis inclusions.

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