Chapter 3

Unveiling the Intricacies

Characterization Techniques for 2D Nanomaterials

Siba Soren

Siba Soren

Department of Chemistry, Govt. Women's College, Baripada, Odisha, India

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Subhendu Chakroborty

Subhendu Chakroborty

Department of Basic Sciences, IITM, IES University, Bhopal, India

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Rudra N. Purusottam

Rudra N. Purusottam

Department of Chemistry, University of Miami, Coral Gables, FL, USA

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Amiya Ranjan Panda

Amiya Ranjan Panda

Kabi Samrat Upendra Bhanja (KSUB) College, Bhanjanagar, Ganjam, Odisha, India

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First published: 19 April 2024

Summary

Thin layers that may have a thickness of at least one atomic layer make up two-dimensional (2D) nanomaterials. These nanomaterials have significantly more atoms on their surfaces than bulk materials because of their high aspect ratio (surface-area-to-volume ratio). The presence of more surface atoms alters the behavior of 2D nanomaterials because they serve a different purpose than the interior atoms. A great variety of characterization techniques for 2D materials are highlighted in this chapter. The advantages of each technique are discussed, including those of X-ray diffraction, scanning electron microscopy, transmission electron microscopy, atomic force microscopy, X-ray photoelectron spectroscopy, and Raman spectroscopy. These techniques allow for the investigation of the 2D materials’ flake size and shape, number of layers, conductivity, morphology, and chemical composition.

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