One-shot device testing data analyses have recently received great attention in reliability studies. This chapter provides an overview on one-shot device testing data collected from accelerated life-tests (ALTs). It surveys typical examples of one-shot devices and associated tests in practical situations. The chapter provides some examples of one-shot device testing data that are typically encountered in reliability and survival studies. As one-shot devices (such as ammunition or automobile airbags) are usually kept for a long time in storage and required to perform its function only once, the reliability required from such devices during their normal operating conditions would naturally be high. Constant-stress accelerated life-tests and step-stress accelerated life-tests are two popular ALT plans that have received great attention in the literature.