Interface Interaction in Metal-C60 Nanostructured Thin Films

A. Devenyi

A. Devenyi

National Institute for Physics of Materials, P.O. Box MG7, RO-76900 Bucharest-Magurele, Romania

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A. Belu-Marian

A. Belu-Marian

National Institute for Physics of Materials, P.O. Box MG7, RO-76900 Bucharest-Magurele, Romania

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R. Popescu

R. Popescu

National Institute for Physics of Materials, P.O. Box MG7, RO-76900 Bucharest-Magurele, Romania

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D. Macovei

D. Macovei

National Institute for Physics of Materials, P.O. Box MG7, RO-76900 Bucharest-Magurele, Romania

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P.B. Barna

P.B. Barna

Research Institute for Technical Physics and Materials Science, Budapest, Hungary

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J.L. Labar

J.L. Labar

Research Institute for Technical Physics and Materials Science, Budapest, Hungary

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R. Manaila

R. Manaila

National Institute for Physics of Materials, P.O. Box MG7, RO-76900 Bucharest-Magurele, Romania

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First published: 27 June 2000

Summary

The present paper reports on structural evidence for interface interaction in nano-systems Cu-C60and Au-C60, prepared as co-evaporated thin films. X-ray diffraction, EXAFS and Raman evidence will be brought forward.

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