The Imaging of Small Domains of J-Aggregated Dye Molecules by Scanning Near-Field Optical Microscopy
Jörg Heimel
Physikalisches Institut, Universität Muenster, Wilhelm Klemmstr. 10, 48149 Muenster
Search for more papers by this authorHarald Fuchs
Physikalisches Institut, Universität Muenster, Wilhelm Klemmstr. 10, 48149 Muenster
Search for more papers by this authorUlrich C. Fischer
Physikalisches Institut, Universität Muenster, Wilhelm Klemmstr. 10, 48149 Muenster
Search for more papers by this authorJörg Heimel
Physikalisches Institut, Universität Muenster, Wilhelm Klemmstr. 10, 48149 Muenster
Search for more papers by this authorHarald Fuchs
Physikalisches Institut, Universität Muenster, Wilhelm Klemmstr. 10, 48149 Muenster
Search for more papers by this authorUlrich C. Fischer
Physikalisches Institut, Universität Muenster, Wilhelm Klemmstr. 10, 48149 Muenster
Search for more papers by this authorAbstract
The concept of high resolution imaging of a sample on a metal substrate by scanning near field optical microscopy (SNOM) with the tetrahedral tip is used for imaging of domains of oriented dye molecules on a metal substrate at a resolution in the order of 10 nm. The metal substrate is important for obtaining a high resolution in the SNOM images and at the same time it is expected to provide a mechanism for an increased contrast in SNOM imaging by scanning probe enhanced elastic scattering of molecules in the gap between a metal tip and a metal surface.
References
- [1] Koglin, J., Fischer, U.C., Fuchs, H., Phys. Rev. B 55; 12 (1997) 7977-7984
- [2] Heimel, J., Fischer, U.C., Fuchs H., J Microscopy 202 (2001) 53-59
- [3] Fischer, U.C., Heimel, J., Jpn. J. Appl. Phys. 40 (2001) 4391-4394
- [4] Rigler, R., Orrit, M., Basché T. Single molecule spectroscopy. Springer Series in Chemical Physics 67; Schaefer, F.P., Toennies, J.P., Zinth W. eds. Springer Verlag, Heidelberg, 2001
- [5] Paesler, M.A., Moyer P.J. Near-field optics, theory, instrumentation, and applications. Wiley Interscience New York 1996.
- [6] Fischer U.C., Scanning Near Field Optical Microscopy. In: Analytical Scanning Probe Microscopy. Wiesendanger R. Ed. Springer Verlag Heidelberg 1998
- [7] Betzig, E., Trautman, J.K., Harris, T.D., Weiner, J.S., Kostelak, R.L., Science 251 (1991) 1468-1470.
- [8] Hosaka, N., Saiki, T.J., Microscopy 201 (2001) 362-364
- [9] Veerman, J.A., Otter, A.M., Kuipers, L., van Hulst, N.F., Appl. Phys. Lett. 72 (1998) 3115-3117
- [10] Eckert, R., Freyland, J.M., Gersen, H., Heinzelmann, H., Schürmann, G., Noell, W., Staufer, U., de Rooij, N.F., J. Microscopy 202 (2001) 7-11.
- [11] Naber, A., Molenda, D., Fischer, U.C., Maas, H.-J. Höppener, C., Lu, N., Fuchs, H., Phys. Rev. Lett., in press
- [12] Betzig, E., Chichester R.J. Science. 262. (1993) 1422-1425
- [13] Moerner, W.E., Kador, L., Phys. Rev. Lett. 62 (1989) 2535 - 2538.
- [14] Fischer, U.C., Koglin, J., Fuchs, H., Journal of Microscopy, 176 (1994) 231-237
- [15] Fischer, U.C., Dereux, A., Weeber, J.C., Controlling Light Confinement by Excitation of Localized Surface Plasmons. In: Near-Field Optics and Surface Plasmon Polaritons. Kawata, S., ed. Topics in Applied Physics 81 (2001) 49-69.
- [16] Fukumoto, H., Yonezawa, Y., Thin Solid Films 327-329 (1998) 748-751
- [17] Fischer, U.C., Bortchagovsky, E.G., Heimel, J., Hanke, R.T., Appl. Phys. Lett. 80 (2002) 3715 - 3717
- [18] Bortchagovsky, E.G., Fischer, U.C.J., Chem Phys. 117 (2002) 5384-5392
- [19] Bortchagovsky, E.G., Fischer, U.C., Thin Solid Films, submitted
- [20] Maas, H.-J. Naber, A., Fuchs, H., Fischer, U.C., Weeber, J.C., Dereux, A.J., Opt. Soc. Am, B 19 (2002) 1295-1300.
- [21] Kerker, M., Dau-Sing Wang, Chew, H., Applied Optics 19 (1980) 4159-4173.
- [22] Zenhausern, F., Martin, Y., Wickramasinghe, H.K., Science 269. (1995), 1083 - 1085
- [23] Gerritsen, J.W., Boon, E.J.G., Janssen, G., van Kempen, H., Appl. Phys. A 66 (1998) S79 – S 82.
- [24] Kobayashi T. J-Aggregates World Scientific Publishing Co. Singapore 1996
- [25] Naber, A., Fischer, U.C., Dziomba, T., Kirchner, S., Kollar, G., Chi, L.F., Fuchs, L.F., J, Phys. Chem. B 103, (1999). 2709-2717.
- [26] Pedarnig, J.D.; Specht, M.; Heckl, W.M.; Hänsch, T.W., Appl. Phys. A 55 (1992) 476-477
- [27] Fischer, U.C., Pohl, D.W., Phys. Rev. Lett. 62 (1989) 458 - 461.
- [28] Fischer, U.C., J. Opt. Soc. Am. B 3 (1986) 1239 – 1244.
- [29] Aravind, P.K., Metiu, H., Surface Science 124 (1983) 506-528
- [30] Takemori, T., Inoue, M., Ohtaka, K., J. Phys. Soc. Jpn. 56 (1987) 1578-1602
- [31] Krenn, J.R., Dereux, A., Weeber, J.C., Bourillot, E., Lacroute, Y., Goudonnet, J.P., Schider, G., Gotschy, W., Leitner, A., Aussenegg, F.R., C. Girard. Phys. Rev. Lett. 82 (1999) 2590-2593
- [32] Berndt, R., Photon emission from the scanning tunneling microscope. In: Scanning Probe microscopy. Analytical methods. Wiesendanger, R., Ed. Springer Heidelberg (1998), 97-134.
- [33] Fischer, U.C., Heimel, J., Maas, H.-J., Fuchs, H., Weeber, J.C., Dereux, A., Superresolution Scanning Near- Field Optical Microscopy. To appear in: Optical Nanotechnologies - The Manipulation of Surface and Local Plasmons. Tominaga, J., Tsai, D.P., eds. Topics in Applied Physics, in press.
- [34] Pettinger, B., Picardi, G., Schuster, R., Ertl G., Electrochemistry 68 (2000) 942-949.
