Volume 2015, Issue 1 751698
Editorial
Open Access

Testing, Measurement, and Characterization of Nanomaterials

Bei Peng

Corresponding Author

Bei Peng

School of Mechatronics Engineering, University of Electronic Science and Technology of China, Chengdu, Sichuan 611731, China uestc.edu.cn

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Changhong Ke

Changhong Ke

Department of Mechanical Engineering, Binghamton University, State University of New York (SUNY), Binghamton, NY 13902-6000, USA binghamton.edu

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Yaling Liu

Yaling Liu

Department of Mechanical Engineering and Mechanics, Lehigh University, PA 18015, USA lehigh.edu

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Yong Zhu

Yong Zhu

Department of Mechanical and Aerospace Engineering, North Carolina State University, Raleigh, NC 27695-7910, USA ncsu.edu

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First published: 12 October 2015

Materials and structures at the nanoscale often have unique mechanical, electronic, or optical properties. With emergence of various novel nanoscale materials and structures over the past decades, traditional testing and characterization techniques may not be suitable any more especially when structures are formed with sizes comparable to any of many possible length scales. In this special issue, original research articles were selected which cover the mechanical, electrical, thermal, optical, and biological properties of a broad range of nanomaterials. We hope the special issue will stimulate finding of new phenomena and properties and developing novel techniques for testing and characterization of nanomaterials.

Bei  PengChanghong  KeYaling  LiuYong  Zhu

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