Volume 5, Issue 4 071348 pp. 373-383
Article
Open Access

A Case Study of Self-Checking Circuits Reliability

Jien-Chung Lo

Jien-Chung Lo

Department of Electrical and Computer Engineering The University of Rhode lsland Kingston, RI 02881-0805, USA , uri.edu

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First published: 01 January 1998
Citations: 1

Abstract

In this paper, we analyze the reliability of self-checking circuits. A case study is presented in which a fault-tolerant system with duplicated self-checking modules is compared to the TMR version. It is shown that a duplicated self-checking system has a much higher reliability than that of the TMR counterpart. More importantly, the reliability of the self-checking system does not drop as sharply as that of the TMR version. We also demonstrate the trade-offs between hardware complexity and error handling capability of self-checking circuits. Alternative self-checking designs where some hardware redundancies are removed with the lost of fault-secure and/or self-testing properties are also studied.

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