Volume 21, Issue 6 pp. 1367-1369

A high-precision instrument for mapping of rotational errors in rotary stages

Weihe Xu

Weihe Xu

Photon Sciences, Brookhaven National Laboratory, Upton, NY 11973, USA

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Kenneth Lauer

Kenneth Lauer

Photon Sciences, Brookhaven National Laboratory, Upton, NY 11973, USA

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Yong Chu

Yong Chu

Photon Sciences, Brookhaven National Laboratory, Upton, NY 11973, USA

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Evgeny Nazaretski

Evgeny Nazaretski

Photon Sciences, Brookhaven National Laboratory, Upton, NY 11973, USA

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First published: 01 October 2014
Evgeny Nazaretski, e-mail: [email protected]

Abstract

A rotational stage is a key component of every X-ray instrument capable of providing tomographic or diffraction measurements. To perform accurate three-dimensional reconstructions, runout errors due to imperfect rotation (e.g. circle of confusion) must be quantified and corrected. A dedicated instrument capable of full characterization and circle of confusion mapping in rotary stages down to the sub-10 nm level has been developed. A high-stability design, with an array of five capacitive sensors, allows simultaneous measurements of wobble, radial and axial displacements. The developed instrument has been used for characterization of two mechanical stages which are part of an X-ray microscope.

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