Volume 29, Issue 5 pp. 206-210
Research Article
Free to Read

Sialolith Characterization by Scanning Electron Microscopy and X-ray Photoelectron Spectroscopy

C. Bahadir Giray

Corresponding Author

C. Bahadir Giray

Department of Oral Surgery, Faculty of Dentistry, Hacettepe University, Ankara, Turkey

A. Umran Dogan, Department of Chemical and Biochemical Engineering, University of Iowa, Iowa City, Iowa, USASearch for more papers by this author
Meral Dogan

Meral Dogan

Department of Geological Engineering, Hacettepe University, Ankara, Turkey, and Department of Civil and Environmental Engineering, University of Iowa, Iowa City, Iowa, USA

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Ayse Akalin

Ayse Akalin

Department of Oral Surgery, Faculty of Dentistry, Hacettepe University, Ankara, Turkey

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Jonas Baltrusaitis

Jonas Baltrusaitis

Department of Chemistry, and Central Microscopy Research Facility, University of Iowa, Iowa City, Iowa, USA

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Daniel C. N. Chan

Daniel C. N. Chan

Division of Operative Dentistry, Department of Oral Rehabilitation, Department of Oral Biology and Maxillofacial Pathology, Medical College of Georgia, Augusta, Georgia, USA

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H. Catherine W. Skinner

H. Catherine W. Skinner

Department of Geology and Geophysics, Yale University, New Haven, Connecticut, USA

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A. Umran Dogan

A. Umran Dogan

Department of Geological Engineering, Ankara University, Ankara, Turkey, and Department of Chemical and Biochemical Engineering, University of Iowa, Iowa City, Iowa, USA

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First published: 04 October 2007
Citations: 14

Abstract

The objective of this study has been to characterize sialolith, a calcium phosphate deposit that develops in the human oral cavity, by high-resolution field emission scanning electron microscopy (SEM) and X-ray photoelectron spectroscopy (XPS). The morphological and chemical data obtained helped in the determination of their formation mechanism in salivary glands. Sialoliths in the submandibular salivary glands may arise secondary to sialodenitis, but not via a luminal organic nidus. We believe this is the first study that characterizes a sialolith by XPS. SCANNING 29: 206-210, 2007. © 2007 Wiley Periodicals, Inc.

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