Volume 6, Issue S2 pp. S662-S665
Contributed Article

Geiger mode simulation of GaN homojunction avalanche photodetectors

Sriraaman Sridharan

Sriraaman Sridharan

School of Electrical and Computer Engineering, Georgia Institute of Technology, 210 Technology Circle, Savannah, GA 31407, USA

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P. D. Yoder

Corresponding Author

P. D. Yoder

School of Electrical and Computer Engineering, Georgia Institute of Technology, 210 Technology Circle, Savannah, GA 31407, USA

Phone: +1 912 966 7940, Fax: +1 912 966 7928Search for more papers by this author
S. C. Shen

S. C. Shen

School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA 30332-0250, USA

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J. H. Ryou

J. H. Ryou

School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA 30332-0250, USA

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R. D. Dupuis

R. D. Dupuis

School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA 30332-0250, USA

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First published: 26 May 2009
Citations: 4

Abstract

We investigate the Geiger mode operation of wurtzite GaN-based homojunction avalanche photodiodes (APDs) via full-band ensemble Monte Carlo charge transport simulation. Critical design parameters for photon counting applications are identified, and their influence on single photon detection efficiency (SPDE) is quantified. Simulations demonstrate simultaneous reduction in breakdown field strength and growth in SPDE with increasing active region thickness. We also report a significant increase in avalanche growth rate with reduction in active region thickness, and relate for the first time the characteristic time scale to the product of avalanche coefficients and saturated drift velocities. (© 2009 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim)

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