Volume 3, Issue 4 pp. 1042-1045
Original Paper

A high-resolution electron microscopy study of MgxZn1–xO films grown on MgO/c-sapphire

Z. Vashaei

Corresponding Author

Z. Vashaei

Center for Interdisciplinary Research, Tohoku University, Aramaki-Aza-Aoba, Aoba-ku, Sendai 980-8578, Japan

Phone: +81 22 215 2074, Fax: +81 22 215 2073Search for more papers by this author
T. Minegishi

T. Minegishi

Center for Interdisciplinary Research, Tohoku University, Aramaki-Aza-Aoba, Aoba-ku, Sendai 980-8578, Japan

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H. Suzuki

H. Suzuki

Center for Interdisciplinary Research, Tohoku University, Aramaki-Aza-Aoba, Aoba-ku, Sendai 980-8578, Japan

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M.W. Cho

M.W. Cho

Institute for Materials Research, Tohoku University, Katahira 2-1-1, Aoba-ku, Sendai 980-8577, Japan

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T. Yao

T. Yao

Center for Interdisciplinary Research, Tohoku University, Aramaki-Aza-Aoba, Aoba-ku, Sendai 980-8578, Japan

Institute for Materials Research, Tohoku University, Katahira 2-1-1, Aoba-ku, Sendai 980-8577, Japan

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First published: 16 March 2006
Citations: 3

Abstract

We report on the microstructure of MgxZn1–xO films grown on MgO/c-sapphire by P-MBE. Cross sectional specimens of three layers with rock salt, wurtzite, and mixed crystal structure were studied by high-resolution transmission electron microscopy (HRTEM). Selected area diffraction pattern (SADP) and fast fourier transform (FFT) were also employed to analyze the samples. The results indicate the growth of cubic-MgZnO along the [111] direction accompanied by twinning. HRTEM micrograph of wurtzite-MgZnO confirmed that initial stage of the growth starts with a cubic structure and then changes to the wurtzite phase. Our results demonstrate that by introducing a thin MgO buffer layer, growth of cubic-MgZnO with low Mg content is feasible. (© 2006 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim)

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