Volume 211, Issue 2 pp. 323-328
Original Paper

Temperature-dependent interlayer coupling in Fe3Si/FeSi2 artificial lattices

Ken-ichiro Sakai

Corresponding Author

Ken-ichiro Sakai

Department of Applied Science for Electronics and Materials, Kyushu University, Kasuga, Fukuoka, 816-8580 Japan

Department of Control and Information Systems Engineering, Kurume National College of Technology, Kurume, Fukuoka, 830-8555 Japan

Corresponding author: e-mail [email protected], Phone: +81 942 35 9203, Fax: +81 942 35 9307

e-mail [email protected], Phone: +81 92 583 8845, Fax: +81 92 583 8845

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Yuta Noda

Yuta Noda

Department of Applied Science for Electronics and Materials, Kyushu University, Kasuga, Fukuoka, 816-8580 Japan

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Daiki Tsumagari

Daiki Tsumagari

Department of Applied Science for Electronics and Materials, Kyushu University, Kasuga, Fukuoka, 816-8580 Japan

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Hiroyuki Deguchi

Hiroyuki Deguchi

Faculty of Engineering, Kyushu Institute of Technology, Kitakyushu, Fukuoka, 804-8550 Japan

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Kaoru Takeda

Kaoru Takeda

Department of Electrical Engineering, Fukuoka Institute of Technology, Fukuoka, 811-0295 Japan

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Tsuyoshi Yoshitake

Corresponding Author

Tsuyoshi Yoshitake

Department of Applied Science for Electronics and Materials, Kyushu University, Kasuga, Fukuoka, 816-8580 Japan

Corresponding author: e-mail [email protected], Phone: +81 942 35 9203, Fax: +81 942 35 9307

e-mail [email protected], Phone: +81 92 583 8845, Fax: +81 92 583 8845

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First published: 04 December 2013
Citations: 6

Abstract

Fe3Si/FeSi2 artificial lattices, wherein ferromagnetic (F)/antiferromagnetic (AF) interlayer coupling between the Fe3Si layers were induced by controlling the thickness of FeSi2 layers, were prepared on Si(111) substrates by facing targets direct-current sputtering. The interlayer couplings were investigated at different temperatures by measuring the magnetization curves. The AF coupling at room temperature was gradually weakened with a decrease in the temperature, and it finally became ferromagnetic or noncoupled at temperatures lower than 77 K. We consider that the FeSi2 layers act as semiconductors and their change in the electric state for the temperature induces the interlayer coupling switching.

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