CdSe nanowires (NWs) have been prepared by a solution–liquid–solid (SLS) approach using Bi nanocatalysts. Structural characterization has been performed by X-ray powder diffraction providing an admixture of wurtzite and zinc-blende (ZB) structure units separated by different types of stacking faults. The relative contributions of ZB type stacking units within the NWs were determined to be in the order of 3–6% from a set of ratios of reflection intensities appearing in only wurtzite structure to those appearing in both ZB and wurtzite (W) structure. In addition, the anisotropy of domain size within the NWs was evaluated from the evolution of peak broadening for increasing scattering length. The coherence lengths along the growth direction are found to be changing between 16 and 21 nm, smaller than the results obtained from TEM measurement, while the NW diameters are determined to be between 5 and 8 nm which is in good agreement with TEM inspection.

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Volume206, Issue8

Special Issue:High Resolution X‐Ray Diffraction and Imaging (XTOP)

August 2009

Pages 1752-1756

X-ray investigation of CdSe nanowires

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X-ray investigation of CdSe nanowires

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