Samples cut out from different regions of SrLaGaO₄ (SLG) single crystal grown along [001]-direction were studied with a number of X-ray diffraction topographic methods exploring both conventional and synchrotron X-ray sources. The synchrotron investigation included in particular white beam projection transmission topography at ultra short wavelength and taking monochromatic beam topographs at different points of the rocking curves at different azimuths. The methods enabled the evaluation of the character of lattice deformation connected with the characteristic ‘rod-like’ defects observed in the core region of the crystal. A shrinkage of the material inside the defects was indicated.

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Volume206, Issue8

Special Issue:High Resolution X‐Ray Diffraction and Imaging (XTOP)

August 2009

Pages 1816-1819

Synchrotron topographic studies of growth defects in the core of a SrLaGaO₄ single crystal

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Synchrotron topographic studies of growth defects in the core of a SrLaGaO4 single crystal

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Synchrotron topographic studies of growth defects in the core of a SrLaGaO₄ single crystal