Volume 1, Issue 2 pp. 315-322
Original Paper
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A new method for measuring the ionized-impurity concentration in high-purity materials

A. Alberigi Quaranta

A. Alberigi Quaranta

Istituto di Fisica, Università di Modena

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C. Canali

C. Canali

Istituto di Fisica, Università di Modena

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G. Ottaviani

G. Ottaviani

Istituto di Fisica, Università di Modena

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A. Taroni

A. Taroni

Istituto di Fisica, Università di Modena

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First published: 16 February 1970
Citations: 5

Abstract

A new method for the measurement of the ionized-impurity concentration in high-purity materials is proposed. Experimental results are given for n-type silicon samples. These results are then compared with those obtained by conventional methods.

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