Volume 3, Issue 7 pp. 268-272
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Analysis of microstrip-like transmission lines with finite metallization thickness

Chung-Hsing Tan

Chung-Hsing Tan

Department of Electrical Engineering Tatung Institute of Technology Taipei, Taiwan

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The-Nan Chang

The-Nan Chang

Department of Electrical Engineering Tatung Institute of Technology Taipei, Taiwan

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First published: July 1990
Citations: 1

Abstract

The transverse modal analysis (TMA) method is used for deriving the dispersion characteristics of microstrip-like transmission lines with finite metallization thickness. Instead of using strip currents as source quantities, the aperture fields are employed for applying the Galerkin method. Numerical results show that the metallization thickness will decrease the propagation constant of both shielded microstrips and suspended strip lines. To verify the accuracy of the present method, the results are also compared with those obtained by other methods.

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