Volume 64, Issue 11 pp. 1931-1936
RESEARCH ARTICLE

A circuit-topology and cascade-based de-embedding for GaN transistor microwave characterization

Fengyi Huang

Corresponding Author

Fengyi Huang

School of Cyber Science and Engineering, Southeast University, Nanjing, China

Correspondence Fengyi Huang, School of Cyber Science and Engineering, Southeast University, Nanjing 210096, China.

Email: [email protected]

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Zhennan Wei

Zhennan Wei

School of Information Science and Engineering, Southeast University, Nanjing, China

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Xusheng Tang

Xusheng Tang

School of Cyber Science and Engineering, Southeast University, Nanjing, China

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Youming Zhang

Youming Zhang

School of Cyber Science and Engineering, Southeast University, Nanjing, China

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Nan Jiang

Nan Jiang

RFIC Department, S-TEK Research Center, Shanghai, China

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First published: 13 July 2022

Abstract

We present a novel approach to the de-embedding for transistor microwave modeling based on a cascade configuration with an open-thru structure. The thru dummy is represented by a π-type circuit topology including a series branch and a shunt branch without resorting to a specific lumped-element equivalent circuit. The proposed method provides a simple way for de-embedding with a high accuracy similar to the conventional approaches based on complicated multiple-thru structures.

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