A circuit-topology and cascade-based de-embedding for GaN transistor microwave characterization
Abstract
We present a novel approach to the de-embedding for transistor microwave modeling based on a cascade configuration with an open-thru structure. The thru dummy is represented by a π-type circuit topology including a series branch and a shunt branch without resorting to a specific lumped-element equivalent circuit. The proposed method provides a simple way for de-embedding with a high accuracy similar to the conventional approaches based on complicated multiple-thru structures.
Open Research
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