Microwave and Optical Technology Letters

A CPW linear resonator method for the microwave characterization of high dielectric constant films

Luciene S. Demenicis

Instituto Militar de Engenharia (IME), Rio de Janeiro, Brazil

Rodolfo A. A. Lima

Centro de Estudos em Telecomunicações, Pontifícia Universidade Católica do Rio de Janeiro (PUC-Rio), Rua Marquês de São Vicente, 225–22453-900 Rio de Janeiro, Brazil

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Luiz Fernando M. Conrado,

Luiz Fernando M. Conrado

Centro de Estudos em Telecomunicações, Pontifícia Universidade Católica do Rio de Janeiro (PUC-Rio), Rua Marquês de São Vicente, 225–22453-900 Rio de Janeiro, Brazil

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Walter Margulis,

Walter Margulis

ACREO, Stockholm, Sweden

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Maria Cristina R. Carvalho,

Maria Cristina R. Carvalho

Centro de Estudos em Telecomunicações, Pontifícia Universidade Católica do Rio de Janeiro (PUC-Rio), Rua Marquês de São Vicente, 225–22453-900 Rio de Janeiro, Brazil

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Luciene S. Demenicis,

Luciene S. Demenicis

Instituto Militar de Engenharia (IME), Rio de Janeiro, Brazil

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Rodolfo A. A. Lima,

Rodolfo A. A. Lima

Centro de Estudos em Telecomunicações, Pontifícia Universidade Católica do Rio de Janeiro (PUC-Rio), Rua Marquês de São Vicente, 225–22453-900 Rio de Janeiro, Brazil

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Luiz Fernando M. Conrado,

Luiz Fernando M. Conrado

Centro de Estudos em Telecomunicações, Pontifícia Universidade Católica do Rio de Janeiro (PUC-Rio), Rua Marquês de São Vicente, 225–22453-900 Rio de Janeiro, Brazil

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Walter Margulis,

Walter Margulis

ACREO, Stockholm, Sweden

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Maria Cristina R. Carvalho,

Maria Cristina R. Carvalho

Centro de Estudos em Telecomunicações, Pontifícia Universidade Católica do Rio de Janeiro (PUC-Rio), Rua Marquês de São Vicente, 225–22453-900 Rio de Janeiro, Brazil

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First published: 26 January 2007

https://doi.org/10.1002/mop.22176

Citations: 6

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Abstract

A coplanar waveguide linear resonator technique for the experimental characterization of the dielectric properties of films in the microwave frequency range at room temperature is proposed. The approach is simple to implement as it consists of a film with unknown high dielectric constant deposited over the resonator, printed on standard alumina substrate using conventional photolithography process. The technique is illustrated by the measurement of the dielectric constant and losses of various ceramic screen-printed thick films: BaTiO₃ (BTO), CaCu₃Ti₄O₁₂ (CCTO), and a BTO(x)–CCTO(1 − x) composite with different concentrations (x = 0.2, 0.5, and 0.8). © 2007 Wiley Periodicals, Inc. Microwave Opt Technol Lett 49: 521–524, 2007; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.22176

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Volume49, Issue3

March 2007

Pages 521-524

A CPW linear resonator method for the microwave characterization of high dielectric constant films

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A CPW linear resonator method for the microwave characterization of high dielectric constant films

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