Volume 8, Issue 1 1900685
Full Paper

Defect-Rich Graphene Architecture Induced by Nitrogen and Phosphorus Dual Doping for High-Performance Supercapacitors

Chaonan Wang

Chaonan Wang

College of Materials Science and Engineering, Guizhou Minzu University, Huaxi District, Guiyang City, Guizhou Province, 550025 China

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Shengyun Luo

Shengyun Luo

College of Materials Science and Engineering, Guizhou Minzu University, Huaxi District, Guiyang City, Guizhou Province, 550025 China

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Yinye Yang

Yinye Yang

College of Materials Science and Engineering, Guizhou Minzu University, Huaxi District, Guiyang City, Guizhou Province, 550025 China

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Dasen Ren

Dasen Ren

College of Materials Science and Engineering, Guizhou Minzu University, Huaxi District, Guiyang City, Guizhou Province, 550025 China

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Xu Yu

Corresponding Author

Xu Yu

School of Chemistry and Chemical Engineering, Yangzhou University, 88 South University Ave., Yangzhou, 225009 China

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First published: 18 September 2019
Citations: 7

Abstract

Heteroatom modification of graphene is a promising strategy to improve the electrochemical performance of supercapacitors. Herein, the heteroatom (N and P) dual-doped reduced graphene architecture (NP-rGA) is constructed via the combination of ice-template and thermal activation approaches. The interconnected morphology and surface chemical state of NP-rGA is confirmed by various microscopic and spectroscopic analyses. The formation of N- and P-containing functional groups acts as primary electroactive sites for the fast accommodation/relaxation of protons or electrons. Furthermore, NP-rGA exhibits a significant improvement in pseudocapacitive behavior in contrast to rGA, such as high specific capacitance (307.8 F g−1), excellent rate capability (85.7%), and cyclic stability of 100.1% of its initial cycle. These excellent electrochemical evidences can be assigned to the synergistic effect of hierarchical structure and uniform heteroatom (N and P) doping.

Conflict of Interest

The authors declare no conflict of interest.

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