Volume 17, Issue 10 pp. 3211-3221
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Electron irradiation of poly(olefin sulfones). Application to electron beam resists

M. J. Bowden

M. J. Bowden

Bell Laboratories, Murray Hill, New Jersey 07974

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L. F. Thompson

L. F. Thompson

Bell Laboratories, Murray Hill, New Jersey 07974

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First published: October 1973
Citations: 71

Abstract

All the poly(olefin sulfones) examined degraded rapidly under electron irradiation. The dose required to effect a molecular weight distribution completely separated from the original distribution as required for fractional solution development was similar for all polymers, viz., 1–2 × 10−6 coulomb/cm2. This indicates that they all have similar values for G(scission). The film thickness of the exposed area decreased at a rate dependent on olefin structure and temperature. This process, termed vapor development, has been attributed to concurrent chain scission and depolymerization. Factors determining the rate of depropagation are discussed.

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