Surface and Thin‐Film Analysis, 4 Photon Detection - Raue - Major Reference Works - Wiley Online Library

1.	Total-Reflection X-ray Fluorescence Analysis (TXRF)
1.1.	Principles
1.2.	Instrumentation
1.3.	Spectral Information
1.4.	Quantification
1.5.	Applications
1.5.1.	Particulate and Film-Type Surface Contamination
1.5.2.	Semiconductors
1.5.2.1.	Depth Profiling by TXRF and Multilayer Structures
1.5.2.2.	Vapor Phase Decomposition (VPD) and Droplet Collection
2.	Glow Discharge Optical Emission Spectroscopy (GD-OES)
2.1.	Principles
2.2.	Instrumentation
2.3.	Spectral Information
2.4.	Quantification
2.5.	Depth Profiling
2.6.	Applications
3.	Surface-Sensitive IR and Raman Spectroscopy; Ellipsometry
3.1.	Reflection - Absorption IR Spectroscopy (RAIRS)
3.1.1.	Principles
3.1.2.	Instrumentation and Applications
3.2.	Surface Raman Spectroscopy
3.2.1.	Principles
3.2.2.	Surface-Enhanced Raman Scattering (SERS)
3.2.2.1.	Instrumentation
3.2.2.2.	Spectral Information
3.2.2.3.	Applications
3.2.3.	Nonlinear Optical Spectroscopy
3.3.	UV - VIS - IR Ellipsometry (ELL)
3.3.1.	Principles
3.3.2.	Instrumentation
3.3.3.	Applications
4.	Other Photon-Detecting Techniques
4.1.	Appearance-Potential Methods
4.1.1.	Soft X-Ray Appearance-Potential Spectroscopy (SXAPS)
4.1.2.	Disappearance-Potential Spectroscopy (DAPS)
4.2.	Inverse Photoemission Spectroscopy (IPES) and Bremsstrahlung Isochromat Spectroscopy (BIS)
4.3.	Ion-Beam Spectrochemical Analysis (IBSCA)

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Surface and Thin-Film Analysis, 4 Photon Detection

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Surface and Thin-Film Analysis, 4 Photon Detection

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Surface and Thin‐Film Analysis

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