Amplifier and Transistor Noise-Parameter Measurements*
James Randa,
James Randa
National Institute of Standards and Technology, Boulder, United States
University of Colorado, Boulder, United States
Search for more papers by this authorJames Randa,
James Randa
National Institute of Standards and Technology, Boulder, United States
University of Colorado, Boulder, United States
Search for more papers by this author*
This work was supported in part by the U.S. government and is not protected by U.S. copyright.
Abstract
Methods for measuring the noise parameters of amplifiers and on-wafer transistors are reviewed. After some preliminary background information and conventions are presented, noise parameters are defined and the most common measurement strategies are presented, both for packaged amplifiers and for on-wafer transistors (or amplifiers). The uncertainty analysis for such measurements is reviewed, and check and verification methods are presented.
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Citing Literature
Wiley Encyclopedia of Electrical and Electronics Engineering
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