X-ray Microprobe for Fluorescence and Diffraction Analysis
X-Ray Techniques
First published: 12 October 2012
Abstract
X-ray diffraction and x-ray-excited fluorescence analysis are powerful techniques for the nondestructive measurement of crystal structure and chemical composition. When a small-area x-ray microbeam is used as the probe, chemical composition, crystal structure, crystalline texture, and crystalline strain distributions can be determined. These distributions can be studied both at the surface of the sample and deep within the sample.
This article reviews the physics, advantages, and scientific applications of hard x-ray (E > 3 keV) microfluorescence and x-ray microdiffraction analysis. Because practical x-ray microbeam instruments are extremely rare, a special emphasis is placed on instrumentation, accessibility, and experimental needs which justify the use of x-ray microbeam analysis.
Bibliography
“X-Ray Microprobe for Fluorescence and Diffraction Analysis” in Characterization of Materials, 1st ed., Vol. 2, pp. 939–953, by Gene E. Ice, Oak Ridge National Laboratory, Oak Ridge, Tennessee; Published online: October 15, 2002; DOI: 10.1002/0471266965.com076.
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Key References
Chevallier and Dhez, 1997. See above.
Recent overview of x-ray microbeam science and hardware.
Chung and Ice, 1999. See above.
Derives the mathematical basis for white-beam microdiffraction measurements of the deviatoric and absolute strain tensor and includes a description of the ORDEX program, which automatically indexes multiple overlapping Laue patterns.
Ice, 1997. See above.
Recent overview of x-ray focusing optics for x-ray microprobes with methods for comparing the efficiency of various x-ray focusing optics.
Sparks, 1980. See above.
Quantitative comparison of x-ray microfluorescence analysis to electron and proton microprobes.
