XAFS Spectroscopy
X-Ray Techniques
Steve Heald,
Steve Heald
Argonne National Laboratory, Advanced Photon Source, Argonne, IL, USA
Search for more papers by this authorSteve Heald,
Steve Heald
Argonne National Laboratory, Advanced Photon Source, Argonne, IL, USA
Search for more papers by this authorFirst published: 18 May 2012
Abstract
The x-ray absorption fine structure (XAFS) that is present near x-ray absorption edges contains detailed information about the local structure and bonding of the absorbing atoms. With the advent of intense tunable sources of x-rays using synchrotron radiation facilities, the application of x-ray absorption spectroscopy has become widespread and routine. The XAFS is a local probe sensitive to the location and type of atoms surrounding the absorbing atom. As a local probe, it can be applied to many materials where diffraction-based techniques would be impractical such as resolving the structure near highly dilute components and determining the local structure of atoms in nanoparticles, liquids, metalloproteins in solution, amorphous solids, and poorly crystalline materials. In addition to the direct structural information, the absorption edge position and shape can be used to determine the site symmetry and valence of the absorbing atoms. This chapter describes the physical principles that result in the fine structure, basic experimental techniques, and basic principles for the extraction of the information present in the spectra. It also touches on some of the unique aspects of performing measurements at a synchrotron radiation facility.
Bibliography
-
XAFS Spectroscopy in
Characterization of Materials,
1st ed.,
Vol. 2,
pp. 869–881, by
Steve Heald, Argonne National Laboratory,
Richland, Washington;
Published online: October 15, 2002,
DOI: 10.1002/0471266965.com072.
10.1002/0471266965.com072 Google Scholar
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Key References
- Proceedings of the International Conference on XAFS. The latest edition is: Di Cicco, A. and Filliponi, A. 2009. Proceedings of the 14th International Conference on X-ray Absorption Fine Structure, Camerino, Italy. Task Publishing, Gdansk, Poland.
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A good snapshot of the current status of the applications and theory of XAFS. This conference is held every 3 years.
A comprehensive survey of all aspects of x-ray absorption spectroscopy. Slightly dated on some aspects of the calculation and analysis of multiple-scattering contributions, but a very useful reference for serious XAFS practitioners.
More details on the use and acquisition of near-edge spectra, especially as they apply to surface experiments.
Bunker, 2010. See above.
A recent book covering the modern application of XAFS. Aimed at graduate student level audience.
