Volume 69, Issue 9 pp. 1743-1751

The conductive behavior and structural characteristics in the I+-beam-implanted layer of plasma-polymerized pyrrole film

Zhi Shen Tong

Corresponding Author

Zhi Shen Tong

Department of Basic Sciences, China Textile University, Shanghai, 200051, China

Department of Basic Sciences, China Textile University, Shanghai, 200051, China===Search for more papers by this author
Mei Zhen Wu

Mei Zhen Wu

Department of Basic Sciences, China Textile University, Shanghai, 200051, China

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Tian Shu Pu

Tian Shu Pu

Department of Basic Sciences, China Textile University, Shanghai, 200051, China

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Zheng Yang Zhang

Zheng Yang Zhang

Department of Basic Sciences, China Textile University, Shanghai, 200051, China

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Jing Zhang

Jing Zhang

Department of Basic Sciences, China Textile University, Shanghai, 200051, China

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Ruo Peng Jin

Ruo Peng Jin

Department of Basic Sciences, China Textile University, Shanghai, 200051, China

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De Zhang Zhu

De Zhang Zhu

Shanghai Institute of Nuclear Research, Chinese Academy of Sciences, Shanghai, 201800, China

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Fu Ying Zhu

Fu Ying Zhu

Shanghai Institute of Nuclear Research, Chinese Academy of Sciences, Shanghai, 201800, China

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De Xin Cao

De Xin Cao

Shanghai Institute of Nuclear Research, Chinese Academy of Sciences, Shanghai, 201800, China

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Jian Qing Cao

Jian Qing Cao

Shanghai Institute of Nuclear Research, Chinese Academy of Sciences, Shanghai, 201800, China

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Abstract

A dense organic film was prepared by plasma polymerization of pyrrole. A 20 keV I+ implantation at a fluence of 1 × 1016 ions cm−2 was used to produce a conducting surface layer due to doping. The characteristics of the implanted layer have been investigated using ion beam analysis techniques, X-ray photoelectron spectroscopy, and near-infrared to ultraviolet spectroscopy. The charge carriers transport in this implanted layer was also analyzed in the temperature region of 120 to 297 K. © 1998 John Wiley & Sons, Inc. J. Appl. Polym. Sci. 69: 1743–1751, 1998

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